Agilent Enhances Analyzer

Agilent Technologies' new enhanced Photonic All-Parameter Analyzer cuts cost of testing next-generation photonic components

December 2, 2002

2 Min Read

PALO ALTO, Calif. -- Agilent Technologies Inc. (NYSE: A) today introduced a re-engineered and greatly enhanced version of its Photonic All-parameter Analyzer, an all-in-one solution for the test and validation of critical optical devices such as 10 Gb/s and 40 Gb/s DWDM components. By delivering test results up to 10 times faster than previously possible, the new solution helps optical network component engineers and manufacturers to dramatically cut development and production cost. The enhanced Agilent 81910A Photonic All-parameter Analyzer offers an industry-leading combination of speed and accuracy for all-parameter component test. Dispersion measurement traces can be updated at real-time speed to enable online process control and adjustment. To allow all-parameter measurements anywhere within an unequalled range of 1475 nm to 1620 nm, the instrument now is available with the Agilent 81600B all-band laser, which offers the widest tuning range of any tunable laser source currently available.The 81910A also helps to advance next-generation photonic component designs by providing direct access to the Jones matrix data, an indispensable basis for exhaustive device analysis. Adaptable to ever-changing needs, new software increases the ROI on test equipment by allowing unlimited port testing -- essential to cover a wide spread of devices such as couplers, fiber Bragg gratings, thin film filters and arrayed waveguide gratings. The Agilent 81910A tests all optical component parameters, such as spectral and polarization dependent loss, group delay and differential group delay. These performance parameters are a constant concern in the optimization of high-speed, narrow-spaced DWDM transmission systems. In contrast to traditional approaches based on electronically modulated signals, the Agilent 81910A employs an all-optical method to deliver all-parameter measurements in transmission and reflection simultaneously. By connecting to the device under test only once, test uncertainties and device handling time are minimized compared to measurements carried out on separate, single-parameter test sets. The new software adds a range of analysis algorithms, including the conversion of group delay into chromatic dispersion and differential group delay into polarization mode dispersion. A new application-programmable interface (API) allows remote control of the instrument, enabling smooth integration into manufacturing environments and supporting the easy implementation of advanced measurement solutions.“We enhanced the Agilent 81910A to help customers focus on innovative and rapid product development and cost-effective production,” said Werner Berkel, vice president and general manager of Agilent’s Optical Communication Measurement Division. “The instrument provides insight into a device’s structure to help optimize its design. Reliability paired with extremely fast test times frees up time and budget, reduces costs and increases competitiveness.” Agilent Technologies Inc.

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