PXIT Deploys Tunable Laser Test System

DUBLIN -- PXIT, a manufacturer of PXI based modular test systems, today announced that its CLose-Grid test solution for tuneable lasers has been successfully deployed at Bookham Technology following an extensive evaluation program. Installed at its laser manufacturing facility in Paignton, CLose-Grid will provide high-speed production screening of Chip-On-Carrier devices.

CLose-Grid is a complete production test system specifically designed for high speed production screening, characterization and analysis of Diode Lasers and comprises:

Andy Lindley, Transmitter Test Manager for Bookham Technology, comments:

"The integration of Bookham's skills in manufacturing and test automation, and CLose-Grid’s ability to deliver high-speed quantitative analysis of our laser performance, is a winning combination."

Darach Kelly, Director of Sales and marketing at PXIT, adds:

"In addition to its screening capability, CLose-Grid’s ease of integration and the PXI open system architecture were important factors in the decision to deploy CLose-Grid."

PXIT Ltd.

Bookham Technology plc