Agilent Speeds Components Test

Releases version 2 of its Photonic Foundation Library software, and an inspection system for printed circuit boards

October 1, 2001

2 Min Read

PALO ALTO, Calif. -- Agilent Technologies Inc. (NYSE: A) today introduced a new version of its Photonic Foundation Library, the most flexible and scalable measurement control and analysis software available for optical component and subsystems manufacturing. The new version decreases test time and cost, and improves accuracy through the more efficient use of test equipment. The flexibility of the Photonic Foundation Library, a programming tool for the Agilent Lightwave Measurement System, has been expanded with additional library functions and the Photonic Analysis Toolbox, a ready-to-go, easy-to-operate user interface that speeds component testing. An additional optical test solution will be added soon to Agilent's modular Lightwave Measurement System. The new solution will enable complete characterization of new generation components for high speed optical communication systems. This includes measurements of polarization mode dispersion (PMD) and chromatic dispersion (CD) in addition to insertion loss (IL) and polarization dependent loss. Agilent's Photonic Foundation Library 2.0 enables multistation and shared test equipment support, thus helping to increase equipment utilization with more flexibility. Optimizing the efficiency of the test process not only protects users' investments, it also enables flexible manufacturing capacity even at high volumes. In a separate release:

PALO ALTO, Calif. -- Agilent Technologies Inc. (NYSE:A) today introduced the latest evolution in automated-optical inspection (AOI) technology for the electronics manufacturing industry. As a direct result of consultation with key telecommunication manufacturers and electronics manufacturing service providers, the Agilent SJ50 system focuses simultaneously on delivering faster machines and full 0201 component-inspection capability. The SJ50 incorporates a new generation of AOI technology into a high-performance system that inspects printed-circuit boards at speeds up to 20 percent faster than the previous generation. The new and advanced digital camera technology enables faster image acquisition at superior image quality. New gantry parameters enable faster camera movements. With the release of the SJ50, Agilent becomes the first test equipment provider to offer an optional internal dual lane, which reduces load and unload time to zero. The new software (4.06) will be released with the SJ50, bringing enhanced user interface and algorithm features. The software remains compatible with the SJ10 series, therefore protecting customers' earlier investments. Agilent Technologies Inc.

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