LeCroy Analyzes Data

LeCroy introduces Serial Data Analyzers with X-Stream technology for real-time analysis of high-speed complex data rates

October 2, 2002

2 Min Read

CHESTNUT RIDGE, N.Y. -- LeCroy Corporation has introduced three versions of a Serial Data Analyzer, models SDA 6000 (6 GHz signal capture bandwidth with 75 psec typical risetime for data rates up to 3.5 Gbits/sec), SDA 5000 (5 GHz signal capture bandwidth with 90 psec typical risetime for data rates up to 2.5 Gbits/sec), and SDA 3000 (3 GHz signal capture bandwidth with 150 psec typical risetime for data rates up to 1.25 Gbits/sec). These products make it easy to accurately and reliably perform measurements on high-speed serial data streams. A wide range of target applications include computer (and computer component) design/validation, testing of high speed differential electrical links and capture/analysis of optical signals (up to and including OC-48). The SDAs are designed with a unique user interface that makes the measurement process easy and incorporate LeCroy's patent-pending X-StreamTM technology allowing engineers to conduct real time analysis on high-speed, complex data rates at up to 3.5 Gbits/sec. The SDA 6000 features a 20 GS/s maximum sampling rate, 6 GHz input bandwidth, extremely low trigger jitter (<2.5 psec), long acquisition memory and is designed with a number of specialized analysis tools. In addition to locating signal degradation problems, it can also trace the problem back to its origin, allowing for the comprehensive analysis of serial data streams, telecommunications components, transceiver subassemblies and transmission systems. The SDA 5000 has many of the same features, with 5 GHz bandwidth inputs. Optional accessories include optical to electrical converters and reference receivers with optical bandwidth above 4 GHz. The SDAs high sampling rate and bandwidth allow the Serial Data Analyzer (SDA) to conduct extremely accurate single shot measurements, which is increasingly important when analyzing the packetized data found in today's optical and electrical serial data systems. With the SDA, data is measured bit by bit so that even the smallest signal anomalies - even those that are <400 picoseconds - can be discovered. In addition to locating the problem, the SDA features advanced eye diagram analysis and other troubleshooting tools that allow engineers to find the cause of the anomaly so that it can be easily and quickly corrected. LeCroy Corp.

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