dBm Intros Photodiode System

BOULDER, Colo. -- dBm Optics, Inc. announced its new model 280 Photodiode Test System. This system allows suppliers of PIN and APD photodiodes to characterize the parametric performance of their components in R&D, QA and production. The system is very accurate, fast and inexpensive. It tests photodiode responsivity across wavelength and has unparalleled speed and accuracy in polarization dependent responsivity (PDR) measurement. The 280 System supports both the traditional all-states PDR and the faster, more accurate 4-state and 6-state PDR measurement methods.

The 280 system implements "Real-Time Referencing," a technique developed for dBm Optics' Component Spectrum Analyzer and applied here to the photodiode characterization. Real-Time Referencing eliminates many of the errors that have plagued responsivity measurement (especially polarization dependent responsivity).

The 280 can test one photodiode or hundreds of photodiodes in one system. Measurement noise is very low (below 200 fA). This low noise level allows for very accurate dark current characterization, which is essential in making accurate measurements of this kind. Settable 0-10 V bias voltage from generation is built-in, thus eliminating the need for separate sourcing and measurement--saving additional time and cost.

dBm Optics Inc.