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September 18, 2003
DUBLIN -- PXIT is pleased to announce the launch of its PX2000-333 Digital Communications & Jitter Analyser module at ECOC 2003. The PX2000-333 provides the functionality of two traditional instruments in a single module and complies with the open architecture PXI standard.
Background: High-speed digital signals form the backbone of today’s telecommunications and data networks. These take the form of electrical standards, such as Gigabit Ethernet and IEEE 1394B and optical standards, such as those used in telecomms networks.
The PXIT advantage: The PXIT PX2000-333 utilises leading-edge data acquisition techniques and advanced signal processing to offer Serial Data Analysis, DCA and Jitter Analyser capabilities on one module. Throughput is typically 10 times faster than traditional bench-top instruments.
Supporting up to 10Gb/s (incl. OTN & 10GigE), full spectrum converge (780nm-1620nm) and low signal levels (-20 dBm), it can replace much more expensive and bulky mainframe based instruments, which need multiple plug-in cards. The ability to provide DCA capability (e.g. mask testing and extinction ratio measurement) with Time Interval Analysis (TIA) testing (e.g. Jitter and Wander Spectrum measurement) offers a truly remarkable value proposition. PXIT also provides an electrical balanced input for high-speed serial data analysis and optical receiver test. All this functionality is provided in a 2-slot PXI module, making it ideal for multichannel test applications.
Darach Kelly, Director of Sales and marketing at PXIT, comments: ”By offering a significant reduction in cost and size, compared to traditional instruments, the PXIT Digital Communications & Jitter Analyser makes existing test applications more cost-effective and allows comprehensive testing to be introduced in areas previously considered too cost sensitive.”
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