LeCroy introduces jitter measurement solution that allows for measurement correlation with TIA and sampling oscilloscope methods

October 25, 2004

2 Min Read

CHESTNUT RIDGE, N.Y. -- LeCroy Corporation introduces the ASDA-J, the first jitter solution that can evaluate total jitter, as well as random (Rj) and deterministic (Dj) jitter, using both reference-clock-based and non-clock-based methods. Designed for use with LeCroy's SDA family of serial data analyzers, ASDA-J not only provides the industry's most accurate solution for measuring both optical and electrical serial data signals but also allows for measurement correlation with time interval analyzers (TIAs) and sampling oscilloscopes.

With the ASDA-J solution, a single SDA can perform the same measurements that previously required a real-time digital oscilloscope, TIA, sampling oscilloscope, and bit error rate tester (BERT). It provides engineers with the ability to specify jitter to whatever method is required. A jitter wizard function brings all of the power of these new measurement methods to your fingertips. The wizard guides the user through the instrument setup and automatically detects the sampling rate, bit rate, and pattern length of the signal to achieve the highest accuracy. The result is a single-instrument solution for jitter that can produce significant time and cost savings.

ASDA-J enhances jitter measurement accuracy and utility by adding an "edge-to-edge" jitter measurement mode to the standard "edge-to-reference" mode. This new mode enables the SDA to correlate its jitter measurements with both sampling oscilloscope- and TIA-based instruments. An enhanced precision digital clock recovery system adds the ability to define not only the loop bandwidth but also the shape factor of the phase locked loop, allowing accurate modeling of virtually any receiver. Two additional clock recovery modes for PCI Express and HDMI allow compliance measurements to be made to those standards as well. A filtered jitter mode supports ITU-T and SONET measurements. In this mode, peak-to-peak and RMS values, plus the jitter waveform, are displayed on the SDA's screen.

In addition to providing all the new analysis tools, the ASDA-J maintains the features of the first version ASDA. These features include an eye mask violation locator, bit error analysis, and advanced jitter measurement capabilities, including ISI plots and filtered jitter.

LeCroy Corp.

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