DUBLIN -- PXIT, a manufacturer of PXI based modular test systems, today announced that its CLose-Grid test solution for tuneable lasers has been successfully deployed at Bookham Technology following an extensive evaluation program. Installed at its laser manufacturing facility in Paignton, CLose-Grid will provide high-speed production screening of Chip-On-Carrier devices.
CLose-Grid is a complete production test system specifically designed for high speed production screening, characterization and analysis of Diode Lasers and comprises:
CLose-Grid 3.0, a sophisticated test and analysis software suite based on a powerful client/server software architecture to provide failsafe detection of sub-standard lasers
A high-speed PXI based test platform equipped with PX2000-305, Laser Current Source/Measure modules and a PX2000-306 Optical Power Meter.
Andy Lindley, Transmitter Test Manager for Bookham Technology, comments:
"The integration of Bookham's skills in manufacturing and test automation, and CLose-Grid’s ability to deliver high-speed quantitative analysis of our laser performance, is a winning combination."
Darach Kelly, Director of Sales and marketing at PXIT, adds:
"In addition to its screening capability, CLose-Grid’s ease of integration and the PXI open system architecture were important factors in the decision to deploy CLose-Grid."
PXIT Ltd.
Bookham Technology plc