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Optical components

Santec Unveils Tunable Laser, Optical Test System

KOMAKI, Japan -- Santec, a leading designer and manufacturer of tunable lasers, optical instruments, and fiber-optic components, introduces the Full-band High Performance Tunable Laser System, Full-band TSL that covers the ultra-wide tuning range of 1260 to 1680nm (O-band to U-band). The system combines up to four Santec tunable lasers (TSL-510 and TSL-710) with an optical switch module (OSU-100, new) and control software. The complete Full-band TSL has excellent cost performance, high wavelength accuracy and fast sweeping for use in both R&D and production environments. The Full-band TSL can be easily controlled via GPIB and USB on PC using the custom GUI.

The Full-band TSL may be configured with Santec’s Swept Test System hardware to provide WDL and PDL measurements over the entire tuning range from 1260 to 1680nm.

Features

  • 420nm wide wavelength range, 1260-1680nm
  • Mode-hop-free wavelength sweeps
  • 100nm/s sweep speed
  • Easy and automatic operation by exclusive software

    Applications

  • Optical component characterization
  • Fiber optic transmission testing
  • Photonic material characterization
  • Optical spectroscopy

    This product will be exhibited at OFC2015.

    In a separate release:

    Santec, a leading designer and manufacturer of tunable lasers, optical instruments, and fiber-optic components, introduces the Swept Laser-based high speed WDL and PDL Test System. The system streamlines photonic testing, providing a complete solution where high-speed analysis, along with high resolution and accuracy are key. Combining one of Santec’s tunable lasers (TSL-510 or TSL-710) with an optical multi power meter (MPM-200, new), a polarization control unit (PCU-100, new) and custom software, the complete Swept Test System optimizes WDL and PDL measurement for use in both R&D and production environments. Using real-time referencing, while simultaneously acquiring output power from the tunable laser and the transmitted optical power through the DUT, the system provides high accuracy in WDL and PDL analysis. The Mueller Matrix method is used to generate fast PDL measurements.

    A simplified system is available by combining a Santec Swept Processing Unit (SPU-100) and any basic power meter or photodetector. The resulting Swept Test System variant can be used for WDL measurements. Over-sampling and a rescaling algorithms are used to maximize testing throughput while maintaining measurement integrity. The system is particularly suited to transmission spectra characterization such as those required for DWDM components and High Q photonic devices. Rapid sweep and accurate measurement saves time and bring high confidence to device characterization.

    Features

  • Real-time power referencing
    - Accurate WDL/PDL characteristics measurement
    - High power repeatability <+/-0.02dB
    - High PDL repeatability +/-0.01dB
    - Automatic normalization of laser source power
  • Rescaling algorithm
    - High wavelength resolution and accuracy
    - Reduced measurement time
  • Multi-channel measurement is available.
  • Supports LabVIEW control software
    - Convenient set up of measurement parameters
    -Data analysis

    Applications

  • Optical components and modules characterization
    - Tunable Filters, Interleavers, Fiber Bragg Gratings (FBGs), Couplers, Splitters, Isolators, Switches
    - WSS, Wavelength Blockers
    - DWDM components
  • Photonic material characterization
  • Optical spectroscopy

    This product will be exhibited at OFC2015.

    Santec Corp.

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