HAWTHORNE, Calif. -- UDT Sensors, Inc., a subsidiary of OSI Systems (Nasdaq: OSIS), announces a new series of three dual sandwich detectors. These two-color photodiodes are compact, hermetically sealed and feature low noise and extremely wide spectral range (400 nm-1800 nm). Specified temperatures are measured by taking the ratio of radiation intensities of two adjacent wavelengths and comparing them with the standard black body radiation curves. Ideal for optical remote temperature measurements, the sandwich detectors are independent of emissivity, and unaffected by moving targets or contaminants in the field of view.

The various types of dual sandwich detectors are the Silicon-Silicon (one photodiode is stacked upon the other), the Silicon-InGaAs (indium gallium arsenide) version which extends the wavelength (the bottom photodiode is made of InGaAs), and the Silicon-InGaAs which also comes with a two-stage TEC (thermo-electric cooler) for stabilized, extremely accurate measurements. Applications for UDT's new detector series include flame temperature sensing, spectrophotometry, dual wavelength detection, and IR (infrared) temperature monitoring for heat treating, induction heating, and process monitoring of other metal parts.

UDT Sensors Inc.