Digital Lightwave Unveils All Path Testing

Feature enables testing of all STSs/AU containers within a Sonet/SDH signal, up to 192 simultaneous tests at OC192 or STM64

April 7, 2009

1 Min Read

CLEARWATER, Fla. -- Digital Lightwave®, Inc. (OTC BB:DIGL.OB - News), a leading provider of optical networking test equipment and technology, today announced the All Path Testing™ (APT) Test Option for NIC Platform products.

This new breakthrough feature enables testing of all STSs/AU containers within a SONET/SDH signal, up to 192 simultaneous tests at OC-192 or STM-64. All Path Testing can operate with mixed mapping types for testing of today's complex networks and includes auto-configure and simultaneous service disruption measurement. The new feature is available as a Test Option for the NIC Platform's NextGeneration Multi-Rate (NGMR) modules.

"Today's network operators are continually forced to provide more diverse and complex services while time and money constraints are very real," says Doyle Mills, Director of Product Marketing for Digital Lightwave. "Testing today's large cross-connects and Multi-Service Provisioning Platforms (MSPP) with many ports and tributaries has previously required multiple test sets or many extra days of testing with a single instrument. Our new All Path Testing feature, in conjunction with the NIC Platform's scalability and multi-channel testing capabilities, offer exactly what network operators need to efficiently deploy and maintain complex networks."

Existing Digital Lightwave test instruments can be upgraded with All Path Testing. Contact any Digital Lightwave sales location today for more information.

Digital Lightwave Inc.

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