Comprion Offers LTE Test SIM

PADERBORN, Germany -- After releasing its first LTE Test (U)SIM in July 2010,COMPRION now also offers an LTE Test (U)SIM supportingthe Third Form Factor (3FF).

As mobile devices get more and more complex, thecomponents used become smaller and smaller. Withthe launch of the new LTE Test (U)SIM supporting the3FF format, also known as Micro-SIM or Mini-UICC,COMPRION is responding to this trend. The LTE Test(U)SIM in the Mini-UICC format is only half the size of aregular Plug-In card and can be used in very small mobiledevices.

Just like COMPRION’s first released LTE Test (U)SIM,this new 128K/J LTE Test (U)SIM includes all new LTEdata fields up to Release 9. The card has three applicationsimplemented: a Test SIM; a Test USIM; and a TestISIM. The Test (U)SIM also supports the three voltageclasses 1.8V, 3V and 5V.

Standardised commands such as “Resize” (for extendingthe size of a data field) and “Create” (for creatingnew data fields) are supported. The Test Card’s flexibilityand feature range enable the user to comprehensivelyexamine the functionality of an LTE mobile devicewithout having access to a live LTE network.To ensure backwards compatibility to the Plug-In format,COMPRION also offers a Mini-UICC Adapter to turnthe Mini-UICC into the Plug-In format. Hence, the Mini-UICC can also be used in today’s mobile phones.

Comprion GmbH