Sun Creates Test Center

Sun has combined its RFID Test Center with the Sun Advanced Product Testing (APT) environmental test laboratory

June 5, 2006

1 Min Read

SANTA CLARA, Calif. -- Sun Microsystems (Nasdaq: SUNW - News) today announced that it has combined its RFID Test Center with the Sun Advanced Product Testing (APT) environmental test laboratory to meet the growing demands of customers to test multi-vendor RFID and sensor solutions for the ability to withstand extreme, "real-world" environmental conditions.

Companies from around the world have used the Sun RFID Test Center to simulate thousands of RFID and sensor deployments to verify that multi-vendor solutions are interoperable and meet industry technical standards and mandates. Sun is reorganizing the RFID Test Center into its Colorado-based Sun APT lab to add the ability to test RFID and sensor solutions under adverse environmental conditions such as excessive heat and cold, shock, humidity, vibration, altitude and pressure. The new facility is called the Sun Advanced Product Testing Lab for RFID and Sensors.

"Our previous RFID Test Center has been extremely successful helping customers take their first steps toward implementing comprehensive RFID solutions that are interoperable and meet industry standards and mandates," said Jim Del Rossi, RFID facility director, Sun Microsystems. "Combining our RFID Test Center with Sun's premier APT environmental test lab lets our customers take that next step -- to conduct real-world, industrial-strength tests to verify whether RFID solutions can withstand the harsh field environments found in military, shipping, aerospace, medical and other settings."

Sun Microsystems Inc.

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