Anite Shows Off

Anite and Sequans demo advanced mobile WiMax features at Mobile World Congress; Anite, Agilent, and NXP showcase LTE

February 11, 2008

2 Min Read

BARCELONA -- Anite, a global leader in testing technology for the wireless industry, and Sequans Communications, a leading supplier and developer of Fixed and Mobile WiMAX semiconductor solutions, today announced a demonstration of advanced Mobile WiMAX features at Mobile World Congress 2008. The demonstration will show Sequans’ SQN 1130 working with Anite’s Mobile Base Station Emulator to simulate advanced Wave 2 Mobile WiMAX functionality including handover and MIMO.

The capabilities showcased at Mobile World Congress represent the significant achievements made by Sequans and Anite during a partnership announced in September 2007. Working in close collaboration, the companies have proven Sequans’ Wave 2 mobile station designs with over one hundred test cases.

Such demonstrations are significant as they show some of the Wave 2 testing methodologies and solutions that will be needed as part of the WiMAX Forum® certification programme. Certification represents a crucial final stage of testing for WiMAX™ equipment, and shows that it conforms to the WiMAX Forum technology and can interoperate with products from other vendors.

“Anite have worked closely with us to create test solutions that anticipate and meet our conformance testing requirements for our leading-edge WiMAX technology,” said Ambroise Popper, Director of Product Marketing, Mobile Chipsets, Sequans Communications. “Securing the right testing partner is fundamental to our ongoing effort to take an early lead in this market.”

In a separate release:

BARCELONA -- Anite, a global leader in testing technology for the wireless industry, today announced a joint demonstration with NXP Semiconductors of Long Term Evolution (LTE) technology at Mobile World Congress 2008. The companies will showcase video streaming over the air using NXP’s LTE platform, working seamlessly with Anite protocol testing tools.

In November 2007, Anite and Agilent Technologies announced a strategic partnership to deliver industry-leading 3GPP LTE test solutions to wireless R&D engineers designing next-generation mobile communications products. This collaboration has extended to engagements with such companies as NXP to create a portfolio of first-to-market test solutions to accelerate the commercialisation of LTE technology.

"Close cooperation with test and measurement partners is crucial when a new cellular standard like LTE evolves. As such, our collaboration with Anite and Agilent is a key enabler for rapid verification of NXP’s software defined modem technology, Embedded Vector Processor (EVP), as new releases from 3GPP become available," says Johannes Kneip, LTE Program Director for NXP Semiconductors. "As proof of such fruitful cooperation the joint demonstration at Mobile World Congress shows NXP's EVP-based LTE IOT platform in combination with an Anite tester, with both implementations consistent to the latest 3GPP specifications.”

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