Agilent Technologies to demonstrate bench-top LTE RF mobile device characterization on E6620 platform

February 17, 2009

3 Min Read

BARCELONA, Spain -- Agilent Technologies Inc. (NYSE: A) today announced it will demonstrate LTE EVM, Tx power measurements and downlink transmit diversity for mobile device test using the E6620 wireless communications test set here at Mobile World Congress. Agilent will offer these capabilities for bench-top device test via LTE mobile test software for the E6620, as well as in its design verification test system based on the E6620. This demonstration marks the first-ever public showing of LTE UE RF measurements on a one-box tester.

"The E6620 wireless communications test set platform is the cornerstone of Agilent's product portfolio for testing LTE mobile devices across the entire R&D lifecycle," said Niels Faché, vice president and general manager of Agilent's Mobile Broadband Division. "Partnering with Anite, we have already developed several first-to-market LTE test products to ensure the success of LTE deployment to meet aggressive time-to-market goals. Providing UE RF measurements to further meet the needs for LTE device design empowers our customers to stay at the forefront of this fast-evolving technology."

In a separate release:

BARCELONA, Spain -- Agilent Technologies Inc. (NYSE: A) today introduced a MIMO/multi-port connectivity option for its N8300A wireless networking test set. Creating a 'multi-up' solution by allowing users to test multiple WLAN (WiFi) devices or modules using a single N8300A, the option is ideal for cell phone and ODM manufacturing engineers testing high volumes of WiMAX and WLAN mobile subscriber devices or modules.

Agilent's new MIMO/multi-port connectivity option is just one new Agilent measurement solution on display here at the 2009 Mobile World Congress. While each solution features a unique set of functionality, they all share the ability to enable the design and test of products for a mobile world.

The Agilent MIMO/multi-port connectivity option is a 4-port RF I/O switching module for MIMO manufacturing test. Designed for use in WLAN 802.11n manufacturing test, it features high RF output power and improved RF specifications like source amplitude range. Such functionality minimizes external amplification costs and compensates for fixture losses, lowering test costs and simplifying the production test system.

A key feature of Agilent's MIMO/multi-port connectivity option is its receiver test broadcast mode, which decreases calibration time by up to 3X for faster production throughput. Because it provides simultaneous transmission from the same source to all four ports at a high power level (e.g., greater than +10 dBm for a modulated signal), DUT 1, DUT 2, DUT 3 and DUT 4 receivers can all be calibrated or tested in parallel.

"Agilent's N8300A solution targets WiMAX and WLAN transmitter and receiver test applications," said Niels Faché, vice president and general manager of Agilent's Mobile Broadband Division. "The introduction of the MIMO/multi-port connectivity option further increases the value of the N8300A by providing faster receiver calibration for the greatest device throughput using broadcast mode, and lowest test cost using the 4-port RF I/O switching module's high power and improved RF specifications."

In a separate release:

BARCELONA, Spain -- Agilent Technologies Inc. (NYSE:A - News), Hong Kong Applied Science and Technology Research Institute (ASTRI), and picoChip today announced a TD-LTE demonstration to be hosted here by the TD-SCDMA Industry Alliance (TDIA).

The demo will use Agilent equipment to test a TD-LTE femtocell jointly designed by ASTRI and picoChip. It will also be the first demonstration of MIMO testing of a TD-LTE femtocell. In addition, Agilent and ASTRI will join picoChip in its booth (1D56) to demonstrate a live HD-video demo using the same TD-LTE technology.The demonstration shows how these products are a powerful, scalable design and test platform that supports the TD-LTE Radio Access Network (RAN) eNode B stations and User Equipment (UE) development lifecycle -- from early physical layer and protocol development to conformance test.

“Agilent is committed to providing TD-LTE design and test solutions early in the design cycle so our customers can meet their aggressive development schedules,” said Guy Sene, vice president and general manager of Agilent’s Signal Analysis Division.

Agilent Technologies Inc. (NYSE: A)

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