BLACKSBURG, Va. -- Luna Technologies announces the enhancement of its award-winning Optical Vector Analyzer (OVA) platform with the addition of an external laser (OVA-EL) version for optical component and subassembly testing applications. The OVA-EL solution minimizes capital outlay by providing cost-effective integration of existing equipment into an all-parameter, single-channel analyzer at half the price of an OVA with internal laser.

The new Luna product is ideal for all-parameter testing of passive optical components in the S, C and L communication bands. When used with an Agilent 81640 (models “A” and “B”) or 81600 series external tunable laser, the OVA-EL accurately measures device characteristics such as insertion loss, group delay, chromatic dispersion, polarization mode dispersion, polarization dependent loss, optical phase error, and time domain information. The OVA-EL can also be upgraded to include Luna’s Optical Frequency Domain Reflectometer, a system for measuring minute reflections in components and assemblies with breakthrough resolution and precision.

“Luna’s new external laser is the perfect choice for users that already own the Agilent tunable laser,” says Luna Technologies’ Chief Technical Officer, Mark Froggatt. “This is a great way to minimize capital expense while maximizing usability.”

The Luna OVA-EL will be demonstrated at the 2004 Optical Fiber and Communications Conference in Los Angeles in February (booth #2238) with immediate availability and 4 to 6 weeks delivery.

Luna Technologies Inc.