JDS Uniphase broadens Multiple Application Platform (MAP) and SWS-OMNI test product lines, demonstrates new applications at ECOC

September 24, 2003

2 Min Read

RIMINI, Italy -- JDS Uniphase Instrumentation is demonstrating its expanded Multiple Application Platform (MAP) and SWS-OMNI product lines for test and measurement of optical and electro-optical components at the European Conference on Optical Communications (ECOC) September 22-24. The added capabilities help customers meet the more complicated, multi-function test and measurement requirements resulting from the trend toward higher levels of integration in the optical components industry.

Expanded MAP Product Line
JDS Uniphase Instrumentation’s expanded MAP provides a common platform for optical and electro-optical signal routing and conditioning functions for transmission module testing. The same platform can be used to measure passive spectral properties such as loss and reflection. Since it supports single mode and multimode fibers at all key communication wavelengths it can be used to test for IEEE 802.3ae, SONET/SDH, 4.25 Gb/s Fibre Channel and POP4 and SNAP12 MSA parallel optics requirements.

The MAP’s new Direct Modulation CATV Transmitter Module and a Ribbon Fiber Power Meter that can test cables with up to 72 fibers will be announced at ECOC. In addition, a three-slot, bench top alternative to the 8-slot rack mount version of MAP, and an RF switch module to interface electrical test equipment to E/O and O/E converters, expected later this year, and will be previewed.

Expanded SWS-OMNI Product Line
The SWS-OMNI, based on patented swept wavelength source technology, uses one laser shared across test bands, and provides both high speed and high resolution in one test instrument, thereby offering potential savings when compared to other methods. A single SWS-OMNI can be used for testing in S, C and L bands, and previous versions can be now be upgraded to test the entire1520-1630 nm wavelength range in a single scan, and be upgraded from C and L bands to also have the capability to test in S band (1420 to 1520 nm). The SWS-OMNI can now also measure chromatic and polarization mode dispersion. Dynamic range has been increased from 50 dB to 57 dB.

JDS Uniphase continues to develop swept wavelength technology and was recently awarded United States patent 6,552,782, adding to JDS Uniphase's existing family of patents for swept wavelength measurement.

JDS Uniphase Instrumentation will also be exhibiting SQ Switch products, including a working demonstration of its Network Access Switch, which is expected later this year. This instrument has been developed for network deployment for testing in applications such as commissioning and protection switching.

JDS Uniphase Instrumentation will be exhibiting in stand #567 at ECOC.

JDS Uniphase Corp.

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