WaveFront Instruments introduces optical MEMS characterization and measurement system for analysis of electro-mechanical behavior
January 14, 2004
GOLDEN -- WaveFront Instruments LLC announced today the introduction of the M510 Ultra-High Speed, Precision Optical MEMS Measurement System and the OmniVue XP Analysis and Control Software. The M510 is an integrated, ultra-high speed, high resolution Micro-Optic-Electro-Mechanical (MOEMS or Optical MEMS) Characterization and Measurement System. When combined with the OmniVue XP Windows based parametric analysis software, the system becomes an ideal tool for fast, accurate analysis of the electro-mechanical behavior of Optical MEMS components.
Key Product Features:
Ultra-Accurate Mirror Deflection Angle Measurement Capability
Ultra-High Speed Mirror Time Response Measurement Capability
2 Independent User Programmable Arbitrary Waveform Generators
4 Independent User Programmable Static Voltage Channels
Full X-Y Automated Alignment
"The M510 provides all electro-optic stimulus and measurement capabilities necessary to fully characterize mirror actuation response in one compact instrument" said Tony Cline, WaveFront's Founder. "The system can be operated in either Engineering mode or Automated mode allowing for operation from the development lab to the production floor. The tight synchronization of source voltage and measurement capabilities ensures the highest possible accuracy available."
WaveFront Instruments LLC
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