Anritsu Tests OFC

Anritsu is participating in the Optical Internetworking Forum (OIF) demonstration

March 8, 2006

5 Min Read

ANAHEIM, Calif. -- Anritsu Company introduces the MP1800 Series Signal Quality Analyzers, featuring a modular architecture that creates a uniquely flexible, compact, and cost-efficient test solution for measuring the bit error rate (BER) of optical transceiver modules and other digital devices throughout the product life cycle. Engineered for both cost-conscious manufacturing and advanced R&D, the MP1800 Series can grow and expand unlike any other analyzer. Unique options range from inexpensive integrated optics to large parallel configurations with external mux/demux that extend frequency coverage to 43.5G and beyond.

Users can choose the 4-slot MT1810A, the 6-slot MP1800A, or the 16-slot MT1820A, depending on the testing requirements. The flagship 6-slot MP1800A, with its built-in controller, is far more compact than similar BERTs with controllers and is very appropriate for lab use, while the 4-slot unit is optimized for manufacturing and is even smaller and less expensive. The 16-slot unit provides a high-density multiple-port solution suitable for design verification and manufacturing. All configurations fully support 12.5G electrical BER testing and can be enhanced with pluggable optical interfaces supporting SFP or XFP transceivers.

The MP1800 Series’ design makes it easy for users to expand or change configuration to fit virtually any BER test environment, including parallel BERT applications, a wide or narrow range of data rates, and variable-rate clock recovery. The standard configuration includes a 12.5G synthesizer, pulse pattern generator (PPG), error detector (ED) and 128 Mbit user-defined test pattern memory.

The availability of a single BERT architecture that cost-efficiently supports applications from design through manufacturing is a big advantage for customers, who previously had to purchase different types of instruments and then incur large additional development costs because of the incompatibility of programming commands.

The MP1800 Series Signal Quality Analyzers have unique BER testing extendibility to 43.5G and beyond by installing multiple PPG and ED modules and using external 43.5G or higher rate mux/demux and clock source units that are already standard Anritsu products. GPIB and LAN connections support integration into most rack-mount test systems and enable use in other remote control applications.

The MP1800 Series has a starting price of $54,000, with deliveries beginning in July.

In a separate release:

ANAHEIM, Calif. -- Anritsu Company introduces the MP1591A Network Performance Tester featuring a 20-slot chassis design supporting multiple ports of 10M to 10G for Ethernet analysis as well as 1.5M to 10.7G for SONET/SDH, OTN, and jitter analysis. The broad testing capability and high port capacity of the MP1591A makes it a unique single-instrument solution for optical device manufacturers whose products are designed into multi-service transport platforms (MSTPs) and multi-service provisioning platforms (MSPPs), as well as for service providers who must maintain networks utilizing MSTP/MSPP technology.

Continuing Anritsu’s tradition as a leader in optical test and analysis, the MP1591A supports the same modules as Anritsu’s highly successful MP1590 Family and MD1230 Family network and data quality analyzers. With 16 slots available for interface modules, the MP1591A can support Ethernet and IP analysis for up to 16 ports of 10 Gbps or 32 ports of 10/100/1000 Mbps Ethernet as well as SONET/SDH, jitter, or OTN analysis on multiple ports up to 10.7 Gbps. In addition, a new MU120118X-01 WAN-PHY option adds support for increasingly important 10 GbE WAN network testing.

With its enhanced VCAT and LCAS options, the MP1591A can be configured as the industry’s only single-instrument solution for fully testing and verifying Differential Delay, LCAS, and VCAT in next-generation Ethernet over SONET (EoS) networks up to 2.5G. And with its unique 10 Gb differential input/output (I/O) feature, the MP1591A is a superior testing alternative for differential electrical jitter testing of 10G XFP modules and their electrical interfaces to host cards.

Among the options available for the MP1591A is MU159101-30 for high-precision jitter analysis of SONET and SDH. With this option, the MP1591A delivers excellent ±20 mUIp-p accuracy in jitter measurement, measurement repeatability of ±5 mUIp-p, and very low intrinsic jitter of less than 50 mUIp-p. The combination of high accuracy and repeatability with low intrinsic jitter allows the Network Performance Tester to address many of the inherent difficulties and subsequent inaccuracies of jitter analysis. The result is unprecedented ability to perform complete ITU-T O.172 jitter analysis on SDH/SONET, as well as thorough O.173 verification of OTU-1 and OTU-2 transmission equipment during the various stages of design and manufacturing.

For OTN testing requirements, the MP1591A is equipped with Poisson error insertion and variable optical output power functions, so it can efficiently evaluate Forward Error Correction (FEC). The MP1591A can perform Tandem Connection and Automatic Protection Switch (APS) tests on SONET/SDH equipment as well.

The MP1591A is priced at approximately $30,000 for the mainframe. Delivery will begin in Q3 of this year.

In a separate release:

ANAHEIM, Calif. -- Anritsu Company announces that it is participating in the Optical Internetworking Forum (OIF) demonstration on the interoperability of transponders and optical components for Very Long Reach (VR) applications using alternative modulation techniques being conducted at OFC/NFOEC. Anritsu donated its MP1763C 12.5G pulse pattern generator, MP1764D 12.5G error detector, MP1590B network performance analyzer and MS9710C optical spectrum analyzer (OSA) for the demonstration.

“Anritsu has always been a leader in developing new technologies to advance the optical market. Our participation in the OIF demonstration and the Forum’s research is testament to our commitment to the optical marketplace,” said Hiroshi Goto, optical marketing manager for Anritsu. “Additionally, as a leader in optical test, we feel that our participation in such a viable industry group is critical to achieving the advances that will help the market grow.”

Participants will demonstrate interoperability of an application code for VR links. The OIF, working in conjunction with the ITU-T, SG 15 developed the application code (P1V1-2C2) as part of the ITU-T G.959.1 specification. This VR application code was accepted by the ITU during its February 2006 meeting in Geneva, and is based on alternate modulation techniques supporting transmission through 2400 ps/nm of residual dispersion without regeneration or in-line optical compensation. The application code supports carrier requirements for longer reaches at lower costs, and allows for direct upgrade of 2.5 Gb/s to 10 Gb/s VR links.

“The test methodology was derived from the OIF's Transponder Interoperability Implementation Agreement to ensure multi-vendor compatibility,” said Karl Gass of Sandia National Laboratories and the OIF Physical Layer Users Working Group chair. “This is an opportunity for component and module suppliers to demonstrate the maturity of a new industry standard.”

Anritsu Corp.

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