Comprion Unveils LTE Test SIMComprion Unveils LTE Test SIM

Card enables the user to examine the functionality of an LTE mobile device without having access to a live LTE network

July 30, 2010

1 Min Read

PADERBORN, Germany -- COMPRION’s pioneering work in LTE development:COMPRION offers its first commercially available LTETest (U)SIM.

After launching its first LTE combined handset test solution“COMPRION SIMfony LTE” in February 2010,COMPRION now also offers an LTE Test (U)SIM followingthe latest 3GPP specifications.

All new LTE data fields up to Release 9 are included inthe 256K/J Test (U)SIM. The card has implementedthree applications: a Test SIM, a Test USIM and a TestISIM. The Test (U)SIM also supports the three voltageclasses 1.8V, 3V and 5V.

The LTE Test (U)SIM supports the standardised “Resize”command to extend the size of a data field andthe “Create” command with which it is possible to createnew data fields. The card’s flexibility and featurerange enable the user to comprehensively examine thefunctionality of an LTE mobile device without havingaccess to a live LTE network.

Comprion GmbH

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