Sponsors: Agilent Technologies
Host: David Taylor, ITU-T, Anand Ram, Agilent , and David Robertson, Agilent
Date: Wednesday, April 13, 2005
Time: 2:00 p.m. New York / 7:00 p.m. London
Overview:
This Webinar covers the increased occurrence of jitter-related issues due to low-cost pluggable optics, with a focus on the activities within ITU-T O.172 aimed at improving the accuracy of jitter measurement. The key elements of the Webinar can be summarized as follows:

·The increase in jitter generation due to low-cost pluggable optics

·The consequences of inaccurate jitter measurements

·ITU-T jitter measurement equipment standards update by the editor of ITU-T O.172

·The need to increase accuracy and repeatability in jitter measurement equipment

·ITU-T O.172 Appendix 7 – a "Method for Verification of Measurement Result Accuracy"

·Use of jitter measurement equipment’s accuracy map results to set the Pass/Fail threshold

·ITU-T O.172 Appendix 8 – a method for the characterization of transmit-intrinsic jitter

The drive to reduce component costs has made design conformance a challenge and has resulted in modules and network equipment with more marginal performance than traditional higher-cost designs. The need to control the jitter contribution of each component so that the entire system's jitter generation is below Telcordia GR-253-CORE's 100 mUI limit is challenging test equipment vendors’ ability to accurately and repeatedly measure jitter at these low levels with a high degree of confidence. Inaccurate jitter measurements will result in incorrect Pass/fail evaluation of components, linecards, systems, and networks under test. Hours, days, weeks, and millions of dollars could be spent resolving the issue when the root cause was simply inaccurate jitter test equipment.

Much of today's jitter measurement test equipment is simply not accurate enough to use reliably with marginal devices. The ITU-T has recognized the need to improve jitter measurement accuracy and repeatability. This Webinar discusses the uncertainties of the current jitter test equipment and jitter standards, and it explains in detail how a new ITU-T O.172 Appendix 7 procedure provides a "Method for Verification of Measurement Result Accuracy." The Webinar outlines how the next generation of jitter measurement equipment provides much lower intrinsics and can prove its result accuracy under all jitter conditions using the ITU-T O.172 Appendix 7 techniques. The editor of ITU-T O.172 will also provide information on some of the latest standards activities in ITU-T SG4.

The Webinar will also provide details on a method for utilization of individual jitter measurement equipment’s ITU-T O.172 Appendix 7 accuracy map results in order to set the pass/fail threshold for optimal throughput using specific test equipment. This method will provide a higher, and hence easier to meet, pass/fail limit than by simply using the jitter measurement equipment’s published data sheet specification.

Finally, ITU-T O.172 Appendix 8, which is a complimentary method for the characterization of transmit-intrinsic jitter, will be explained. This appendix serves as a diagnostic tool for the characterization of test equipment jitter transmitters under certain restricted conditions.

*This is a custom Webinar. All slides and content matter have been provided by Agilent Technologies. Light Reading does not contribute to any content nor endorse the subject matter.

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