SANTA CLARA, Calif. -- Agilent Technologies Inc. (NYSE: A) today announced it will demonstrate a 32-Gb/s bit error ratio tester with four-tap de-emphasis at the Optical Fiber Communication Conference and Exposition (OFC) and National Fiber Optic Engineers Conference (NFOEC), March 19-21, at the Anaheim Convention Center (Booth 2719), in Anaheim, Calif.
A new era of data-center infrastructure enabling cloud computing, big data and analysis is driving the development of new high-speed data transfer standards such as 100-Gb Ethernet and 32-Gb Fibre Channel. The higher speeds create new testing challenges for designers of servers, network interface cards, backplanes and communication ICs. Thatâ€™s because quality degrades when signals are transmitted over backplanes, printed circuit board traces and long cables.
To address the issue, Agilent has created remotely mountable pattern-generator heads for use with its N4960A BERTs (bit error ratio testers). The new pattern-generator heads (N4951B Option D32 and Option D17) feature integrated four-tap de-emphasis (one pre-cursor, two post-cursors) operating up to 32 Gb/s, which provides designers with the signal compensation required for transmitter emulation when they characterize receivers and systems.
Agilent Technologies Inc.